For studying of the characteristics and structures of material in lacquer layer in Joseon Dynasty, 6 types and 7 pieces of sample were observed with the optical microscope and the polarizing microscope. For analyzing, SEM-EDS and FT-IR were used and TOF-SIMS was also used on trial. The former is directly varnished on the iron layer so the sample includes more iron component than the others. In the results of the trial analyzing in TOF-SIMS, it is possible to verify the minerals on the foundation layer with the infinitesimalsample. The analysis results of lacquer layer with FT-IR are compared with previous studies and all the samples have the spectrum of the lacquer. Through the result of the Joseon lacquer layer, there are not many samples, however, when it compared with unified Silla, the period of the Three States, and the previous era, the lacquer layers are simpler than the relics from previous era. It looks to have the relation with the simplification of manufacturing method because of expanding of the using of lacquer wares.